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System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
- Pickering Interfaces Inc.
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PXI 2.5W Programmable Resistor Module, 1-Channel, 3Ω to 22.3MΩ
40-251-154
The 40-251-154 is a programmable resistor module with 1 channel which can be set between 3Ω and 22.3MΩ with 2Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Communications System Analyzer
Freedom R8200
The Freedom R8200 from Astronics Test Systems represents a major step in the evolution of the Land Mobile Radio Test. The Freedom R8200 is the first and only test instrument that combines comprehensive digital and analog LMR testing with the ability to measure important RF network characteristics, such as Distance to Fault (DTF), Return Loss, and Voltage Standing Wave Ratio (VSWR). The Freedom R8200 is also the only service monitor with the abilityto display advanced RF Parameters in a Smith Chart for more complicated network analysis
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Simulation Systems
Bloomy offers Simulation Systems for Hardware in-the-Loop (HIL) and open loop test of electronic controls and mechanical actuators for all types of transportation and defense systems including aircraft, rail, automobiles and ships. These systems, now deployed at major aerospace, locomotive and military manufacturers and research facilities worldwide, provide world-class, high-fidelity simulated environments for use in both closed-loop and open-loop testing. Because Bloomy’s Simulation Systems are largely constructed from COTS components, time to first test can be reduced significantly, and their highly-customizable nature allows your test system experts to provide your unique IP to differentiate your product from your competitors.
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Brake Test Systems
GIANT Evo
The GIANT Evo is an extension of the well-proven GIANT product portfolio and has been developed to suit the growing demands and needs of the current and future brake markets. Covering the market segments from mini and compact cars to medium sized SUVs as well as large vehicles, this brake testing machine forms the base of HORIBA’s inertia brake dynamometers portfolio. All components are specifically tailored to the needs of the passenger car market segment.
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Power Supply Test System
The Procyon PTS 2100-10 is a configurable turnkey Power Test System, delivering automated test equipment (ATE) to some of the world’s largest-volume manufacturers as well as the affordability needed by niche market producers. Aerospace, defense, and avionics power supply ATE test systems applications include functional testing of AC and DC power supplies, generator, and engine control units, as well as a wide range of associated electronics.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Hybrid Vehicle Battery Simulator and Test System
Winner of the SAE 2008 Technical Award for Hybrid Vehicle Testing Technology, SAKOR Technologies Hybrid Vehicle Battery Simulator and Test System is designed for simulating high-voltage batteries in an electric drivetrain testing environment as well as directly testing high-voltage batteries and charging systems.
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Crash Simulation Systems
The crash simulators are capable of reproducing a wide range of standardized and user-defined crash tests including advanced applications such as side impact and vehicle pitch simulation. Instron’s acceleration sled systems are used for the development and approval of vehicle safety systems, vehicle parts and also for the investigation of solids and structures during crash events.
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Regenerative Power System, 80 V, ±125 A, 5 KW, 400/480 VAC
RP7942A
The Keysight RP7942A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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CMOS/CCD Production Test System
System 1828
The basic system consists of a 225 MHz pattern generator, 10 clock drivers, 6 DC biases, 1-4 channels of 10 MHz 14 bit analog data acquisition and/or 1-4 channels of digital acquisition. Additional options can be added to customize the system to meet your requirements.
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Ultra-Small, High-Shock Ethernet Data Acquisition System
SLICE6
Diversified Technical Systems, Inc.
SLICE6 is a modular data acquisition system featuring unmatched performance, flexibility and reliability in an ultra-small package. SLICE6 makes it easy to build systems in 6-channel increments and supports up to hundreds of channels per test.
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Battery Extra Load Units
Performing capacity/discharge test on a high-capacity battery may be challenging since high requirements are set on the discharge system. In cases when discharge test times need to be reduced, high load capacities are required from the discharge system. The battery extra load unit BXL is an additional load unit designed especially for this purpose.It is primarily used with BLU battery testers. However, the unit is a universal add-on device. This means it can be used as an additional load with any other discharge/capacity tester in the market.When discharge current exceeds the capacity of a single BLU device, extra load unit increases discharge capacity. A system of BLU and BXL instruments enables performing the capacity test in an accurate, user-friendly way in accordance to battery testing standards: IEEE 450-2010, IEEE 1188-2005, IEEE 1106-2015, IEC 60896-11/22, and other relevant standards.
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PXI Precision Resistor Module 9-Channel, 2 to 26.7k
40-297-032
This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI-2510, 68-Channel, 2 A PXI Signal Insertion Switch Module
778572-10
68-Channel, 2 A PXI Signal Insertion Switch Module—The PXI‑2510 fault insertion unit (FIU) is designed for hardware‑in‑the‑loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels that you can open or short to one or more fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXI‑2510 is ideal for validating the integrity of control systems including engine control units (ECUs) and full authority digital engine controls
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Dynamic Electric Motor Analyzers
Baker's dynamic motor test and monitoring instruments are built to conduct condition monitoring tests of motors and generators from a Motor Control Centre (MCC), or through a Baker EP1000 connection unit. The Baker EXP4000 dynamic motor analyser is a low-voltage, AC- and battery-operated instrument that test motors and generators while they are in operation. The EXP4000 provides health and performance data on the motor, the motor's load, and incoming power to assess motor performance and suitability in context of the entire machine system it supports.
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SpaceWire Monitors
This section details the 4Links range of high-performance test equipment that is used to monitor SpaceWire networks. These devices are attached to your SpaceWire systems and then can be accessed via Gigabit Ethernet, using the standard TCP/IP family of protocols, so that they can be controlled remotely (for instance, by partners collaborating on a mission).
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6-Slot LXI/USB Modular Chassis With Scan List Sequencing & Triggering
60-106-002
Pickering Interfaces’ 60-106-002 modular LXI/USB chassis occupies only a small, 1U rack-height form factor, making it suitable for portable and space-restricted rack-mount applications. It features remote control via USB or LXI Ethernet and this version of the chassis includes Scan List Sequencing & Triggering. Remote control over a network enables the switching function of a test system to be located as close as possible to the target equipment.
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SMBus Protocol Exerciser and Analyzer
PGY-SMBus -EX-PD
Prodigy Technovations Pvt. Ltd.
SM Bus Serial bus interface has been widely used for voltage and temperature monitoring of the system. PGY-SMBus -EX-PD is the leading instrument that enables the design and test engineers to test the SM Bus designs for its specifications by configuring PGY-SM Bus -EX-PD as master/slave, generating SM Bus traffic with error injection capability and decoding SM bus Protocol decode packets.
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RF/Switching
SMX-6XXX (RF/Switching)
The VTI SMX-6xxx Series of high density non-blocking RF multiplexers deliver exceptional performance and reliability in a compact single-slot configuration. Front panel connectivity is available in both SMB and PKZ formats to integrate seamlessly into new or existing test systems. Embedded virtual schematic control further simplifies setup and debugging allowing all relays to be engaged independent of application software and device drivers.The SMX-6xxx Series delivers unmatched bandwidth and isolation performance resulting in exceptional measurement integrity that is ideal for the most demanding aerospace, defense and automotive automated test equipment (ATE) applications.
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Shield Level / Pathloss Equipment
SG1000B/PR1000A
The SG1000 Signal Generator and PR1000A Preamplifier have been designed to simplify the measurement of shielding integrity in a shielded enclosure. When coupled with a high stability spectrum analyzer and an appropriate selection of test antennas, the SG1000/PR1000A combination can measure shielding effectiveness at all of the NSA 94-106 (supersedes NSA 65-6) defined test frequencies from 1 kHz to 10 GHz.The PR1000A amplifies the received signal from the test antenna and overcomes the high noise figure of the companion test receiver or spectrum analyzer. The PR1000A will ensure that the system noise figure will be less than 4.5 dB at all test frequencies from 1 kHz to 10 GHz. When used with a spectrum analyzer measurement bandwidth of 100 Hz, the system exhibits a sensitivity of -150 dBm at the test antenna output.To overcome high cable loss between the test antenna and the PR1000A assembly at 10 GHz, a remote low noise pre-amplifier (Praxsym PN 310-010091-001) is mounted directly onto the 10 GHz antenna.
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Automatic Hardness and Density Testing
Automatic Hardness and Density Testing is a revolutionary HDA consists of a hardness tester and a density measuring system which allows tests to be carried out automatically.
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NI Software Suites
NI software suites aggregate the most popular LabVIEW add-ons and other application software typically combined with LabVIEW and other development environments to help you build test, design, and control applications. Each suite, excluding the Multi-IDE Bundle and the Software Platform Bundle, also includes one year of unlimited access to professional training and certification.The suites come with related NI device drivers and are shipped on USB 3.0 media to speed up your installation.The NI Automated Test Software Suite combines LabVIEW, LabWindows/CVI, and Measurement Studio with the TestStand ready-to-run, customizable test executive and the Switch Executive intelligent switch management and routing application to help you build manufacturing or production test systems.The NI Embedded Control and Monitoring Software Suite features LabVIEW and the recommended add-ons specifically for building embedded control and monitoring systems on NI reconfigurable I/O (RIO) hardware. The LabVIEW FPGA Module extends the LabVIEW graphical development platform to target FPGAs on NI RIO hardware, and the LabVIEW Real-Time Module builds on LabVIEW to deliver a programming environment for creating reliable, deterministic, and stand-alone embedded systems.The NI HIL and Real-Time Test Software Suite combines LabVIEW with VeriStand, a configuration-based software environment for efficiently creating real-time test applications. It also includes the LabVIEW Control Design and Simulation, LabVIEW Real-Time, and LabVIEW FPGA modules.To learn more about each suite, use the navigation options on the left side of the page.The mark LabWindows is used under a license from Microsoft Corporation. Windows is a registered trademark of Microsoft Corporation in the United States and other countries.
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6-12V LED Computer-safe Circuit Tester
1673
Peaceful Thriving Enterprise Co Ltd
Check on 6-12V systems. Safely test standard primary automotive circuit and on-board computer controlled electrical system without damaging the micro-processor.
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Printed Circuit Board Testing Solutions
IES Systems is a turnkey test systems solution provider with 10 years of proven experience in printed circuit board testing solutions. Our experienced engineers design electro/mechanical solutions to interface between your product and our custom designed test instrumentation. We provide a complete solution to your PC board testing needs.
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Common Metallic Pendulum Impact Testing Machine
JB-(C/D)
Jinan Testing Equipment IE Corporation
KB- (C/D) common type metallic pendulum impact testing system is the basic model for impact tester. The metallic pendulum impact tester is used to determine the impact resistance of metal materials under dynamic load and capable of doing a large number of impact tests continuously. The display method for the models is different, respectively there are analog dial display, touch screen digital display and computer display. For the later two models, it can display the impact power, impact toughness, and pendulum rotation angle. All the testing reports can be printed out. The metallic pendulum impact testing system is the essential quality control equipment for metal material manufacturers and QC departments, as well as the necessary instrument of research institutes for new material research.
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Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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HIPOT testers
HypotMAX III
Patented SmartGFI® functionStorage of 50 test setupsRemote Safety InterlockUSB/RS-232 or GPIB interfaces availableAdvanced menu driven controlDigitally controlled arc detection systemCHARGE LO® & RAMP HI® systems
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AC Hipot Test Set
Weshine Electric Manufacturing Co., Ltd
AC Hipot Test Equipment for Dielectric Withstand Test are suitable for 50 / 60 Hz AC testing of low capacity test objects. Optionally, these units can also be upgraded to function as DC test sets by mounting the rectifier attachment on top of the transformer.Weshine® AC Hipot Test Set for AC hipot test can be equipped with a rectifier attachment for DC voltage testing.Typical application areas:Testing of cables Testing of switchgearTesting of transformersTesting of CP & PTTesting of MV systems
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Compute Express Link (CXL)
Compute Express Link (CXL) is a new high-speed CPU-to-Device and CPU-to-Memory interconnect designed to accelerate next-generation data center performance. CXL technology maintains memory coherency between the CPU memory space and memory on attached devices, which allows resource sharing for higher performance, reduced software stack complexity, and lower overall system cost. This permits users to simply focus on target workloads as opposed to the redundant memory management hardware in their accelerators. CXL is based on a PCI Express 5.0 Physical layer with speeds up to 32GT/s. Teledyne LeCroy provides protocol analysis test equipment to support development and debug of CXL based devices.
