- CAMI Research Inc.
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Connector Board for Cable and Harness Tester
CB49
Populated with solder pads to accept a suite of TE-Connectivity Micro-MaTch connectors, this board addresses markets plagued by vibration and fretting corrosion, and requiring "miniaturized connectivity". Rated to 500Vdc/350Vac, the CB49 may be used on all CableEye models. The CB49, sold without connectors, contains nine sets of 20 solder pads accommodating numerous configurations of Micro-MaTch connectors.
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SD & Micro SD Duplicators And Testers
International Microsystems Inc.
International Microsystems makes the best SD and Micro SD card tester / copier and duplicator on the market. We can quickly clone your SD memory cards with our fast 8, 16, and 32 slot machines. Our ease-to-use tester/ duplicators support stand-alone operation.
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Hi-Pot Tester
DU3315/3316
Delta United Instrument Co., Ltd.
3 in 1 tester with AC, DC, IR functions ( IR function is optional for DU3316 only)ARC Detction:DU3315 /DU3316 Standard function40 x 4 LCD text displayFast cut-off time : 0.4ms5 sets of memory, 3 steps for each memory
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Portable Force/Displacement Tester
The FSA-MSL Mini Material Tester is a portable force/displacment tester. The FSA-MSL is ideal for tests requiring very small movement, like switch tests. The tester also features a reversible base plate, allowing the tester to be used on uneven or obstructed surfaces. The highly visible EL display and plain language menus in eight languages make programming fast and easy. Both force and displacement values are displayed plus user-selectable data; high/low setpoints, peak, memory data, etc.
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Solderability Tester
LBT210
Microtronic Microelectronic Vertriebs GmbH
Microtronic's LBT-210 solderability tester has software that offers statistical information such as mean value, standard deviation, etc. A camera option offers video of the test cycle and storage in memory with the appropriate test measurements and data. Additionally, it has the feature to test under nitrogen. This function can be switched on in the software. An enclosure that is flooded with nitrogen lowers and rises with the device under test.
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Hi-Pot Tester
DU3315A/3316A
Delta United Instrument Co., Ltd.
Real-time Open Check of the alarm and signal output of no contact signal3 in 1 tester with AC, DC, IR functions ( IR function is optional for DU3316 only)ARC Detction:DU3315A /DU3316A Standard function40 x 4 LCD text displayFast cut-off time : 0.4ms5 sets of memory, 3 steps for each memory
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Semiconductor Memory Tester
T5851
Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well a...show more -
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Single Event Effects Test System
SEE-RAD
The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the newest technology of the Griffin III. With all new high-accuracy DC Parametrics, superior precision pin drivers, and capture memory of 64M, the Griffin SEE-RAD combines the newest innovations in the test industry with our years of experience in Radiation Test.
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization pro...show more -
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Memory Tester
SP3000
CST is proud to offer a portable stand alone and affordable memory tester, combining DIMM and SODIMM testing capability all on the same universal base unit with optional easy plug-on test adapters.
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Sonel Make Digital Insulation Resistance Tester
Sonel (Poland) Digital Insulation Resistance Tester, Range : 0-5kV/5TeraOhms, Battery-cum-Mains Operated, Voltage increment in Steps of 50v & 100V upto 5kV, Memory storage upto 11880 records, Data Transfer to PC/Laptop by USB Port, Free Software, PI & DAR Measurements.
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Test Adapter
RAMCHECK® SIMM
The RAMCHECK SIMM Adapter is another addition to the RAMCHECK memory tester. It provides a needed solution for testing older 72-pin EDO/FPM DRAM SIMM modules. An optional adapter for 30 and 72-pin SIMMs is also available
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Test Adapter
Ramcheck 72 Pro
Our latest addition to the RAMCHECK memory tester provides needed support for testing 72-pin SO DIMM modules used in older laptop computers. The RAMCHECK memory tester automatically detects the presence of the RC 72 Pro adapter
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Memory Burn-In Tester
H5620/H5620ES
As Server and Mobile applications have mainly led the Memory and market has also entered a super cycle that has completely withdrawn from the previous silicon cycle.Memory capacitance will continue to rise as the application of data processing and mobile communication occurs—however, revenue will not grow as ASP goes down. Suppliers need to reduce test costs and increase profits.H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn-in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.
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Memory Burn-In Test
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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Optical Power Meter & VFL & RJ45 Network Test
TM263N
◇ Added Network Cable Test ◇ Accurately test whether a single network cable transmits signals normally ◇ Self Calibration ◇ Set the Auto Off ◇ Wavelength Memory function after turn off the tester ◇ High Accuracy, high ,High sensitivity, high linearity ◇ Stable VFL Output ◇ USB Charge port ◇ FC,SC Connector ◇ 18650Li-ion Battery ◇ Lower power consumption design, long standby time ◇ Rubber Out shell, increased the protective properties for field work
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CT Ratio/Burden Tester
1047
TESCO’s new CT Ratio/Burden Tester (Catalog No. 1047) is a lightweight, portable and highly accurate in-service test set to assist in finding lost revenue by testing the accuracy of your meter circuits. The Tester can help determine if there are installations errors, loose connections, incorrect ratios, resistance buildup, open CT’s, or manufacturers defects. The CT Ratio/Burden Tester measures and displays the primary and secondary current of the CT under test, and the ratio of the currents. All test data is stored in the internal memory and easily uploaded to a PC.
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Memory Tester
RAMCHECK
RAMCHECK is our most advanced memory tester and is the latest in our product line. Highly modular and user friendly, it redefines the capabilities of an affordable and portable ram checker.
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Application Level Tester
The application tester tests the memory devices such as graphic memory and HDD buffer memory in a specially designed condition made similar to actual PC and Server environments. In fact the graphic memory has releatively higher speed, test expense and quality standard compared to main memory, stressing the importance and the need of the application tester.
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Memory Test Systems
T5503HS2
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Memory Tester for DDR4 DIMMS
RAMCHECK LX
USBWith the RAMCHECK LX DDR4 memory tester package (part number INN-8686-DDR4) you can quickly test and identify DDR4 DIMMs that comply with JEDEC standards. Tests are fast, reliable and easy to do. The RAMCHECK LX DDR4 package includes the RAMCHECK LX base tester and 288-pin DDR4 DIMM adapter. (This package is also available with the DDR4 DIMM Pro adapter, featuring a very rugged test socket).
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Gear Teeth Hardness Tester
PHT-1840
This dedicated unit is designed to test gear teeth and other difficult to access applications. The 1840 is loaded with the same features found on the base 1800 version which includes memory, USB output and software for downloading to your PC. The 1840 hardness tester is capable of measuring the surface hardness of a broad variety of metals on flat and round surfaces. This instrument comes complete with a dedicated DL impact device, calibrated test block and rugged carry case.
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PC Crush Tester
DRK113E
Shandong Drick Instruments Co., Ltd.
DRK113E Crush Tester PC is a high accuracy and intelligent instrument, designed according relevant standards. The advanced components, mating parts and micro-computer are logical structured, to ensure the property and appearance.The instrument has parameter testing, adjusting, computer screen display, memory, printing function.
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Memory Module Testers
The module tester tests the modules in which the final tested components are assembled together. This test is also one of the most important factors to guarantee the quality of the products. DDR, DDR2, DDR3, FBDIMM,
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D-SUB (Male)
QSPI
The QSPI represents a multi-function of performance and capabilities for PXI-based digital instrumentation. The QSPI offers high performance pin electronics and 4 I2C masters and 4 32bit counter 4 clock generator in a compact, 3U PXI form factor. Each card can function as a quad sites I2C/SPI device tester, multiple cards can be interconnected, supporting up to 64 sites. The QSPI also supports deep pattern memory by offering 32M of onboard vector memory with dynamic per pin direction control and with test rates up to 10 MHz.
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Downloading Multifunction Tester
ET4500
The new ET4500 tester carries out all the tests needed to verify the safety of electrical installations in domestic, commercial and industrial wiring installations in accordance with the latest regulations.
can be used to carry out 3 wire earth testing and has on board memory to store and download all installation test results for documentation.
Everything about the new ET Series has been designed to save time and make testing easier.Fast, reliable high current and non-trip loop testing comes as standard together with a high level of input protection and a CAT IV safety rating .Supplied with a full range of accessories.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell...show more -
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Memory Tester
RAMCHECK LX DDR3
Quickly test DDR3 DIMM and SO-DIMM memory. In just seconds, RAMCHECK LX will perform a thorough test of the module and provide complete identification. Also tests expensive LRDIMM modules.
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Nand Flash Tester
NplusT
NplusT was created in December 2002 by Tams Kerekes' 20-years experience in the field of electrical semiconductors and reliability testing.The company started with the sales representation of semiconductor equipment and consumable suppliers. In the meantime, qualified engineering services, linked to the represented products, were provided in Europe.In 2003 NplusT started to market "RIFLE", the non-volatile memory engineering tester, and related services. In a few years, this product has become a...show more -
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Protective Bonding Testers
RMO-E Series
The RMO-E instruments are designed and ideal for testing protective bonding (grounding) of equipment following the standard IEC 61010-1. Also, they can measure the resistance of high, middle and low voltage circuit breakers, high-current bus bar joints, cable splices, and welding joints. The instruments accurately measure not only in factory environments but also in high-induction fields and substations.Both models generate a true DC ripple-free (less than 1 %) current with automatically regulat...show more -
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Auditor Torque Cube
ATC Series
The Auditor Torque Cube (ATC) is a compact, versatile desktop tester and provides a multitude of capabilities. The ATC is designed to test hand or power tools with the following: Peak, first peak and track modes. Multiple engineering units. Manual and auto clear function. Multiple frequency response settings. Bi-directional use and accuracy. Accuracy is better than 1% of indicated reading top 90% of range. Serial data output. Memory 999 data samples. Battery and/or mains powered.