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Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
- Taylor Dynamometer, Inc.
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500 HP Complete Bench Hydraulic Test Center
HTC-500
The Hydraulic Test Center (HTC) is a versatile machine designed to test heavy-duty, off-highway hydraulic components. The 500 hp (373 kW) HTC Complete Bench is for the dealer that services components from a predominately larger machine size mix such as large mining machines and large excavators. The Complete Bench offers full functionality to test all types of pumps and motors including: transmissions, hydraulic motors, hydraulic cylinders, valve blocks, torque converters, open and closed loop pumps.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Regenerative Power System, 80 V, ±125 A, 5 KW, 400/480 VAC
RP7942A
The Keysight RP7942A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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NI Software Suites
NI software suites aggregate the most popular LabVIEW add-ons and other application software typically combined with LabVIEW and other development environments to help you build test, design, and control applications. Each suite, excluding the Multi-IDE Bundle and the Software Platform Bundle, also includes one year of unlimited access to professional training and certification.The suites come with related NI device drivers and are shipped on USB 3.0 media to speed up your installation.The NI Automated Test Software Suite combines LabVIEW, LabWindows/CVI, and Measurement Studio with the TestStand ready-to-run, customizable test executive and the Switch Executive intelligent switch management and routing application to help you build manufacturing or production test systems.The NI Embedded Control and Monitoring Software Suite features LabVIEW and the recommended add-ons specifically for building embedded control and monitoring systems on NI reconfigurable I/O (RIO) hardware. The LabVIEW FPGA Module extends the LabVIEW graphical development platform to target FPGAs on NI RIO hardware, and the LabVIEW Real-Time Module builds on LabVIEW to deliver a programming environment for creating reliable, deterministic, and stand-alone embedded systems.The NI HIL and Real-Time Test Software Suite combines LabVIEW with VeriStand, a configuration-based software environment for efficiently creating real-time test applications. It also includes the LabVIEW Control Design and Simulation, LabVIEW Real-Time, and LabVIEW FPGA modules.To learn more about each suite, use the navigation options on the left side of the page.The mark LabWindows is used under a license from Microsoft Corporation. Windows is a registered trademark of Microsoft Corporation in the United States and other countries.
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Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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One Phase Electric Power/Energy Calibrator
MC133
The MC133 master unit model is a one phase electric power/energy calibrator. It can supply the device under test with single phase precise voltage and current with calibrated phase shift along with DC voltage and current capability. Output voltage can be set in five ranges up to 280V and output current in six ranges up to 30A. Simulated electric power can be set independently for each phase. Frequency can be set from 15Hz to 1 kHz with resolution 0.001Hz to 0.01Hz. The MC133 Calibrator is equipped with 5 1/2 digital DC meter with DC ranges 20mA or 10V for direct calibration of various types of power transducers and wattmeters.
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2 GHz Dual 1:4 RF Mux, 50 Ohm Module for 34970A/34972A
34905A
The Keysight 34905A RF multiplexer module for the 34970A/34972A Data Acquisition/Switch Unit offers broadband switching capabilities for high-frequency and pulsed signals. Use it to route test signals between your device under test and your signal generator, oscilloscope, spectrum analyzer, or other instrumentation.
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PXIe-4154, 2-Channel, 8 V, 3 A PXI Programmable Power Supply
781155-01
2-Channel, 8 V, ±3 A PXI Programmable Power Supply—The PXIe‑4154 is a specialized programmable power supply for battery simulation. It is designed to simulate a lithium‑ion battery cell’s transient speed, output resistance, and 2‑quadrant operation (source/sink). Critical to many RF and wireless applications, the simulator’s fast transient response time allows it to rapidly respond to changes in load current with minimal voltage dip, which makes the PXIe‑4154 ideal for powering devices under test (DUTs) such as RF power amplifiers, cellular handsets, and a variety of other mobile devices. To model the behavior of a battery more accurately, you can use the onboard programmable output resistance to simulate a battery’s internal resistance. For quiescent and standby current measurements, the PXIe‑4154 features integrated current measurement.
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Single Board Source/Meter/Switch
SMSU
SMSU Series SourceMeterSwitch Unit (SMSU), introduced by SW Link Ltd, is single-channel voltage/current sourcing, 4X6 switch matrix and measurement instruments. Each Series 100 SMSU instrument tightly integrates highly accurate stable DC power source and a true instrument-grade programmable gain amplifier and 18bits ADC on a 100x100mm PCBs. It can output up to 20V, sub-uA to 1A current to device under test (DUT)
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Line-impedance stabilisation network
NNB 21 set
The NNB 21 line impedance stabilization network is designed for measuring of grid bound interferences of a device under test according to the satndard CISPR 25/ISO 7637. It measures the RF interference, which couples into the vehicle electrical system. Measurements during the development in a frequency range from 100 kHz to 1GHz can be carried out.
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HandyScope HS6-DIFF With SureConnect: 500 MS/s, 250MHz BW, 4 Channel (256MS/ch), USB Differential Digital Storage Oscilloscope, Spectrum Analyzer, Voltmeter, Transient Recorder
HS6-DIFF-500XMS-W5
The only oscilloscope in the world that has:- SafeGround, differential input channels that can be switched to single ended.SureConnect, auto-detects a true connection between the probe tip and the device under test.- CMI interface.- USB 3.0 interface, 5Gb/s data transfer- Lowest noise
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Modular Power
RFP Controller
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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FPGA Image Processing (IP) Development Kit
ProcVision
Gidel’s Vision Pro Development Kit is an optimal solution for developing,validating, demonstrating and evaluating Image Processing (IP) andpipeline designs on FPGA.The suite is designed to provide a complete and convenient envelop enablingthe developer to focus strictly on the proprietary image processingdesign. The entire Vision Pro flow is within a single FPGA, independentof the final target application(s). The Vision Pro flow is composedof a pipeline that streams simulated data to the user image processingdesign under test (DUT) and then captures the design’s output streamfor displaying, storing, analysis and/or co-processing on host software.The entire process is performed on a single FPGA without the need foradditional peripheral connectivity or tools.Vision Pro suite is plug-and-play enabling the developer to begin at oncethe IP design development and validation. A simple design example providesthe developer immediate hands-on familiarization with the systemflow and supporting tools. The final design can be ported to any IntelFPGA device or other vendors’ devices (FPGA or ASIC) by replacing basiclibraries. To significantly reduce compilation time, initial design developmentmay be on a small FPGA device and later compiled for the targetdevice(s). The target implementation may use any FPGA board. For a fullImaging/Vision system solution, Gidel offers a number of off-the-shelfgrabbers and FPGA accelerators that are designed to utilize these imageprocessing blocks and Gidel Imaging Library (GIL).
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12 Channels 1.0 ~ 17.0 Gb/s (200Gbps) Pulse Pattern Generator and Error Detector
CA9806-12
The UC INSTRUEMNTS CA9806-12 is a highp erformance, flexible 12 channels Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (200 G). It is combined with three sets CA9806 4 CH 1.0 to 17.0 Gbps Pulse Pattern Generator and Error Detector that incorporates an external one by 4 rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build-in 8.5 ~ 15 Gb/s eye diagram testing function.
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BERT Measurement Solutions
Bit error rate testers (BERTs) are usually the initial step for communications testing. These instruments generate digital test patterns, typically pseudorandom binary sequences (PRBSs), that drive devices under test (DUTs). Following the transmission of the signal through the link, the receiver in the BERT captures the signal. This setup can be used for multiple testing purposes, such as to evaluate the performance of a transmitter, a receiver, or an optical link.
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Compact Antenna Test Range
700.00 MHZ – 110000.00 MHZ
A Compact Antenna Test Range (CATR) allows electrically large antennas to be measured at a significantly shorter distance than would be necessary in a traditional far-field test range. Compact ranges use a source antenna (feed) to radiate a spherical wave in the direction of a parabolic reflector, collimating it into a planar wave for aperture illumination of a Device under Test (DUT). It's lowest operational frequency is determined by the size of the reflector, its edge treatment and the absorbers. The two edge treatments available are serrated edge for general purpose applications, and rolled edge to achieve higher accuracy for special applications. Multiple-feed systems may be used to improve the far-field characteristics. A compact range test system also allows system level testing of a complete device architecture.
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Test Probe
Beijing KeHuan Century EMC Technology Co,.LTD
Is a physical device used to connect electronic test equipment to a device under test (DUT).
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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PXIe-4140, 4-Channel Source Measure Unit
781742-01
The PXIe-4140 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4140 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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4x8 2 Wire USB Modular Switch Matrix
U2751A
The U2751A USB Modular Switch Matrix offers a flexible connection path between the device under test and the test equipment, thus allowing different instruments to be connected to multiple points on the device under test at the same time. This instrument is able to support measurements at a high bandwidth of up to 45MHz. It uses the common non-proprietary standard high-speed USB 2.0 interface that provides ease of connectivity
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PXIe-2746, 2.7 GHz, Quad 4x1 PXI RF Multiplexer Switch Module
780587-46
PXIe, 2.7 GHz, Quad 4x1 PXI RF Multiplexer Switch Module—The PXIe‑2746 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 2.7 GHz in production test applications. The high channel count of the PXIe‑2746 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.
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Regenerative Power System, 2000 V, ±30 A, 20 KW, 400/480 VAC
RP7973A
The RP7973A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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Pressure Comparator (System E)
P014
AMETEK Sensors, Test & Calibration
The P014 hydraulic jack pump (System E) is an extremely effective pressure pump designed for easy, controlled, high pressure generation. Each comparator includes a 4 connection manifold, which can be used for the reference indicator, the device under test, a fine adjust, an isolation valve, or a fluid reservoir. The adjustable reference pressure port lets you set your reference gauge at the best viewing angle.
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12-Ch 10A RCV Power Distribution Unit
AR438
AR438 module helps with interconnection, power supply and load switching, monophasic and triphasic, adding the current measurement capability up to 10A.Enable input helps for a safe relay disconnection. It is a quick electrical -hardware- disconnection of the relays and is designed to be an auxiliary safety element, so that loads cannot reach the device under test.
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UHS II Protocol Analyzer and Exerciser
PGY-UHS II SD/SDIO
Prodigy Technovations Pvt. Ltd.
UHS II Protocol Analyzer (PGY-UHS II SD/SDIO) is the Protocol Analyzer with multiple features to capture and debug communication between host and design under test. PGY-UHS II SD/SDIO UHS II Protocol Analyzer is the most feature rich comprehensive Protocol Analyzer available to capture and debug UHS-II protocol data. PGY-UHS-II Protocol Analyzer supports FD156 and HD312 data rate. The innovative active probe has minimum electrical loading on device under test (DUT) and captures protocol data without affecting the performance of DUT.
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Regenerative Power System, 80 V, ±250 A, 10 KW, 400/480 VAC
RP7945A
The Keysight RP7945A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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Protection Test Set
CMC 850
The CMC 850 is a protection test set dedicated to IEC 61850. It focuses on the real-time communication methods GOOSE and Sampled Values to interface with the devices under test.
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Power Quality Analyzer
PQM-711
PQM-711 power quality analyzer is an advanced product for wide type of measurements, analysis and recording of network parameters 50/60 Hz and the power quality diagnostic according to European standard EN 50160. PQM-711 is an innovative model with a wireless communication Wi-Fi , which allows for automatic pairing with the included tablet, with a large 10" touch screen. Tablet allows full operating of the analyzer, live data preview and the reading and analysis of data stored in the internal memory. With this solution, the PQM-711 is an unique device that combines the advantages of the analyzer with built-in display and typical portable analyzers (known as Black Boxes).With the tablet you can very fast checked the device under test. On the other hand, you can leave the analyzer module for multi-measurements as a typical logger without display. You can very fast diagnose the machine under test using the tablet. On the other hand, you can leave the analyzer module itself for many days measurement as a typical logger without display. PQM-711 has a transient registration with a maximum sampling rate of 10 MHz (rapid changes in voltage) and control signals. The minimum duration of the registered transient is 650 ns.
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PXIe-2515, 35-Channel, 0.25 A PXI Signal Insertion Switch Module
780587-15
PXIe, 35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXIe‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXIe‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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External Frontend
FE44S
The R&S®FE44S external frontend can extend the frequency range up to 44 GHz for Rohde&Schwarz signal and spectrum analyzers as well as signal generators. The R&S®FE44S enables signal up and downconversion directly at the device under test (DUT), lowering cable losses, increasing sensitivity and delivering more power at the antenna in an OTA environment. The R&S®FE44S uses a single RF connector to further reduce the number of antennas in over the air testing.
