Filter Results By:
Products
Applications
Manufacturers
Data Pattern
Produce data patterns for the assurance of logic circuits and digital semiconductors.
- Pickering Interfaces Inc.
product
PXI/PXIe USB Data Comms Multiplexer, 16-Channel
40-737A-001
The 40-737A-001 (PXI) and 42-737A-001 (PXIe) are 16:1 USB data communications multiplexers suitable for switching USB1 and USB2 data and power connections using a 78 way D-Type connector. The data signal paths are 2-pole arranged as differential pairs as defined by the USB standard. The signal pair has a controlled differential impedance and the multiplexer has been designed for minimum insertion loss. The USB power paths are arranged as a common negative and a switched positive. The power paths are designed to ensure minimum loss of the USB power.
-
product
Digital Test Instrumentation
EDigital-Series™
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
-
product
CMOS/CCD Production Test System
System 1828
The basic system consists of a 225 MHz pattern generator, 10 clock drivers, 6 DC biases, 1-4 channels of 10 MHz 14 bit analog data acquisition and/or 1-4 channels of digital acquisition. Additional options can be added to customize the system to meet your requirements.
-
product
Material Testing Software
TRAPEZIUM X
Windows 10 compatible TRAPEZIUM X can carry out various tests ranging from simple test control to complex custom-made patterns, using the industry's first data search and preview function, free layout reports, visual wizard settings, quick panel, and quick conditions lists.
-
product
80Gbps Video Analyzer/Generator for DisplayPort 2.0 Testing
M42d
The Teledyne LeCroy quantumdata M42d Video Analyzer/Generator provides functional and will support compliance testing for video, audio and protocol of DisplayPort 2.0 and DisplayPort 1.4. The M42d supports legacy DisplayPort lane rates of 1.62, 2.7, 5.4, 8.1 Gb/s and the new DP 2.0 higher speed lane rates of 10.0, 13.5, & 20.0 Gb/s data rates with the new line coding—128b/132b. The protocol analyzer provides a snap shot status view and deep analysis using captures of incoming DisplayPort 2.0 streams from source devices including DSC/FEC compressed streams. The M42d’s video generator can be used for testing silicon as well as devices such as displays, USB-C adapters, extenders, etc. The video generator offers a large library of standard video timings and test patterns necessary for testing next generation high resolution displays.
-
product
8-Channel, 200MHz, 512Kb/channel, Data/Pattern Generator
Acute TD3008E
Model / Data Channel / Event Channel / Pattern DepthTD3008E / 8 / 3 / 512Kb/chTD3116B / 16 / 3 / 1Mb/chTD3216B / 16 / 3 / 256Mb/ch
-
product
Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
-
product
Time Controller
ID900
IDQ’s Time Controller is an all-in-one device designed for flexibility and it efficiently solves a large number of problems encountered in the laboratory. Its core consists of 4 high-speed (<20 ps precision, 100Mcps rate) inputs and 4 high-speed outputs, interconnected by reconfigurable logic. The Time Controller performs the functions of a number of devices: time-to-digital converter, coincidence counter, delay generator, pattern generator, counter and discriminator. This is complemented by a 10Gbps link to the host computer for fast data transfers, by auxiliary analogue and digital I/O for interfacing with external devices.
-
product
Central Office Line Simulator
AI-7280
The AI-7280 is a highly flexible central office line simulator. It is designed primarily for the testing and verification of common terminal equipment, including standard telephones, Caller ID devices, SMS (Short Message Service) capable equipment, and any device using an analog Tip/Ring interface circuit. Supplied with the TRsSim software for Windows, it can analyze a telephone''s DTMF characteristics, pulse dialing and flash timing, generate various network tones and ringing patterns. Both Type I (on-hook) and Type II (off-hook) Caller ID is supported using either FSK or DTMF data transmission. As an optional component, the TRsSim software can perform SMS testing to either the ETSI protocol 1 or protocol 2 standards.
-
product
Food Testers
These automated food testers are designed for clean, smooth trouble-free operation.Food Rheology testers automatically test firmness, elasticity or viscosity using a load cell combined with programmable movement control. The easy-to-use program dial and menu screens control probe positioning and speed. Select from three movement patterns. The USB port streams 1,000 force data/second to the Force Data Analysis Software (included).
-
product
Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
-
product
Renewable Energy Loggers
Data Loggers measure AC & DC circuits for Renewable Energy installations. Record directional flow of current, determine patterns when your system is importing or exporting to the grid.
-
product
Delay Pattern Generator (six-channel Pulse Generator)
DG-8000
*Seamless change: The frequency, pulse width, and other settings can be seamlessly changed during oscillation.*Tracking function: Parameters can be changed at the same time for each channel.*Operation pattern control: The operation pattern option enables continuous operation testing.*Synchronization of multiple generators: The quick synchronization option enables three generators (18 channels) to synchronously output data.
-
product
Pulse Pattern Generator, 3.35 GHz, single channel
81133A
The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
-
product
PXI Digital Waveform Instrument
PXI Digital Waveform Instruments feature up to 32 channels, can sample and generate digital waveforms at up to 200 MHz, and interface with various standard TTL and low-voltage differential signals (LVDS), as well as settable voltage levels. These devices offer per clock cycle, per channel bidirectional control, and phase shifting. They include deep onboard memory with triggering and pattern sequencing. Some models also support doubledatarate (DDR) technology and real-time hardware data comparison. You can use Digital Waveform Devices to create device simulation and complex stimulusresponse tests.
-
product
Clock Drivers
Multiple timing signals ("clocks") are required by CCDs, IR FPAs, and some CMOS image sensors to transport electrical charge across the array to a sense amplifier for conversion into image data. Pulse Instruments offers a line of "clock drivers" for generating these timing signals. The parameters of these clocks (clock rate, pulse width, pulse amplitude, rise- and fall-times, etc.) greatly influence the behavior and performance of the imaging device. Our products take logic-level inputs from a pattern generator and allow the user to adjust the output parameters to suit their device and testing requirements. Clocks can be "tweaked" in real-time to determine optimal operating parameters for a particular device, or else programmed in accordance with a test plan for automated production test.
-
product
Thermal Imaging Sensor
3550 FC
Condition monitoring sensor to visualize thermal patterns on multiple assets. Maintenance managers can now collect a more comprehensive variety of key-indicator data — thermal imaging, voltage, current, temperature, and power — on critical equipment to build a real-time picture of an asset's condition. With the right mix of data all in one place, managers can implement planned maintenance and decrease the frequency of preventive rounds.
-
product
Pulse Pattern Generators
PPG
The Pulse Pattern Generator family (PPG), also knows as Serial Data Pattern Generator (SPG), is designed to generate a stream of binary information.
-
product
PCIe-6537B, 32-Channel, 50 MHz, 200 MB/s Digital I/O Device
782631-01
32-Channel, 50 MHz, 200 MB/s Digital I/O Device - The PCIe-6537 can continuously stream data over the PCI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
-
product
Pattern Generators
A Pattern Generator outputs digital data and is used to stimulate circuits. The data can be from user files, previously captured data or from the data creation wizard (editor) in the software. All of our Pattern Generators (digital word generators) are also Logic Analyzers and are controlled with easy-to-use Windows software. Some or all of the outputs are bi-directional and can be used to capture data.
-
product
3D Inline Solder Paste Inspection System
TROI 7700 SERIES
Using Moire' pattern, Pemtron's three-dimensional lead applicationdosage tester combines 2D color images with 3D measurement data toprovide more detailed, near-real PCB images, unlike traditionalcolor maps. We will also provide you with the best solution forhigh-quality and high-precision PCB production with a varietyof statistical programs, along with information you need toquickly and accurately judge positive/failure.
-
product
Operational Intelligence platform
jKool
Operational Intelligence platform as a Service designed to derive meaning from high velocity machine data (FastData) in near real-time. It enables teams to analyze data from various sources such as applications (web, cloud, mobile), logs, transactions, mobile devices, IoT and help you make data driven decisions. Unified application analytics across apps and data silos. Detect patterns, bottlenecks, and anomalies within and across apps.
-
product
RF
Data Patterns has a strong RF and Microwave engineering capability, featuring a team of enthusiastic engineering talent, substantial investments in RF test and measuring instruments, and an attitude to utilise the latest technologies.
-
product
Acute 112-Channel, 16-Event, 400Mbps, 256Mb/channel, Data/Pattern Generator
Acute DG3128B
Model / Data Channel / Event Channel / Pattern DepthDG3064B / 48 / 16 / 256Mb/ch (max)DG3096B / 80 / 16 / 256Mb/ch (max)DG3128B / 112 / 16 / 256Mb/ch (max)
-
product
USB Reusable Temperature and Humidity Data Logger
This reusable logger can monitor temperature and humidity in facilities, storage and processing areas, clean rooms, labs, and during transport. It is equipped with an external sharp tip probe, providing the option to monitor internal core temperature. Data is available in PDF or spreadsheet format and used for various purposes, such as process or equipment verification and validation, thermal mapping, and documenting environmental conditions to meet GMP, GDP and regulatory compliance. Reports are analyzed to identify trends and patterns, and management decisions can be made to improve practices in areas such as processing and cold chain logistics. Data is easy to archive for record keeping, audits, and compliance with FDA, CDC, HACCP, FSMA and other regulatory requirements.
-
product
Digital Flight Control Computer
The Digital Flight Control Computer is a Quadruple Redundant Flight Control Computer designed by DRDO and ADE and manufactured by Bharat Electronics Limited. Data Patterns has designed and manufactured the Automated Test Equipment required for the validation of this DFCC.
-
product
Direct conversion from cycle driven simulation data
Test program generator
Direct conversion from cycle driven simulation data (ATPG scan patterns) (WGL/TDL/STIL) to tester. TDL/WGL/STIL to tester conversion Supports STIL ext 0,1,2 constructs Easy to use and cost effective conversion solution Optimize tester resources usage Supports advanced tester features (Such as Xmode, Multi-port etc’) Compress and minimize vectors count Allow direct tester binary patterns creation
-
product
Avionics Data Bus Tester
Distributed CORVUS
Distributed CORVUS works in conjunction with CORVUS-300 to isolate bus anomalies and fault resolution. The Transmit unit, C-9235-TX, sends 1553 like data pattern through a bus stub and coupler to the Receive unit, C-9235-RX, on another stub. This will measure insertion loss, possible bit errors and correct polarity. The Receive unit can also be used to give a digital scope representation of the active data bus showing signal quality and peak to peak amplitude.
-
product
Pattern Converter for WGL/STIL to ATE
VectorPort
VectorPort is a versatile, low-cost test development tool for converting WGL or STIL vectors to targeted ATE tester formats, including pattern, timing, and pinmap data. VectorPort can read and write all major formats in both parallel (Flat) vectors and serial (SCAN) vectors.
-
product
Simultaneous Multi-Surface Test Interferometer
VeriFire MST
Simplify the complex – multiple surfaces create complex fringe patterns, the Verifire™ MST uses patented wavelength-shifting technology to acquire phase data from multiple surfaces simultaneously. Report key metrics from individual surfaces of parallel windows, transmitted wavefront, as well as precise surface-to-surface information like total thickness variation (TTV), wedge and even material inhomogeneity.
-
product
Microsoft Graph Data Connect
Microsoft Graph is the Microsoft 365 data that describes the patterns of productivity, identity, and security in an organization. Microsoft Graph Data Connect offers developers a highly secure, efficient way to copy Microsoft Graph datasets, at scale, into Azure Data Factory. It's an ideal way to train AI and machine learning models that uncover rich organizational insights and deliver new value to your productivity solutions.
