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- NovaTech Automation
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Test Switch
The W3TS Test Switch, a miniature knife blade switch (5/8 inch centers including barrier) with #10-32 stud terminals, is available in three types: Basic Switch, Short-Circuiting Switch (Shorting Switch), Test Jack Switch
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PCI Express, PCI, Multi-Interface Test Backplanes
Amfeltec PCI Express, PCI, Multi-Interface Test Backplanes
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Multi-Interface Test Backplane
SKU-047-01
The Multi-Interface Test Backplane was designed to support hardware and software designers who need to be able to plug in boards with different interfaces (into the host computer).
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PCI Express Gen 3 Test Backplane
SKU-015-01-PCIe
PCI Express Backplane was designed to support a variety of modern PCI Express board’s production testing and debugging. The backplane expands the Host computer into four x16 PCI Express slots via 10 ft. CAT7 data and 10-pin flat Power control cables. PCI Express Backplane and UUTs (unit under test – add-in PCI Express board) are powered by a standard ATX power supply connected to the backplane via 24 and 8 pin power connectors located on the backplane.
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VME Load Card
WIENER VME load boards are designed to test VME crate power supplies and fan trays by drawing power from the VME backplane and dissipating it as heat. A series of switches on the module front panel allows for easy adjustment of the current draw for each voltage channel.
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Pulse Pattern Generator, 3.35 GHz, single channel
81133A
The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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Signal Integrity Test Products
S1
*Fixtureless Test Solution*Automated Optical Inspection*DC Electrical test*Tests any backplane – Small, large, simple, complex*Now available with 4 heads
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3U VPX Development Kit
This development kit enables efficient 3U VPX backplane design and software verification.- 3U VPX architecture- One CPU blade, one GPU blade (optional), SOSA-aligned- 1TB NVMe pre-installed in CPU blade- Rear transition module(s) included- Test Frame with backplane pre-installed
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PXIe-1085, 18-Slot (16 Hybrid Slots, 1 PXIe Timing Slot), Up to 24 GB/s PXI Chassis
783588-01
PXIe, 18-Slot (16 Hybrid Slots, 1 PXIe Timing Slot), Up to 24 GB/s PXI Chassis—The PXIe‑1085 features a high-bandwidth, all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
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PLTS Measurement And Calibration
N19303B
The new Physical Layer Test System (PLTS) 2024 is the industry standard for signal integrity measurements and data post‑processing high-speed interconnects, such as cables, backplanes, PCBs, and connectors. Signal integrity laboratories worldwide have benefited from the power of PLTS in the R&D prototype test phase.
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PCI Express Gen 1 Test Backplane
SKU-015-01
The PCI Express Test Backplane was designed to support production testing/debugging of PCIe-based peripheral boards. The backplane expands the x1 PCI Express interface of the host computer into one x4 and three x1 PCI Express slots via 7 ft CAT6 cable.
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PXIe-1082, 8-Slot, Up to 8 GB/s PXI Chassis
780321-01
PXIe, 8-Slot, Up to 8 GB/s PXI Chassis—The PXIe‑1082 features a high-bandwidth backplane to meet a wide range of high-performance test and measurement application needs. It accepts PXI Express modules in every slot and supports standard PXI hybrid-compatible modules in up to four slots. The chassis features an extended operating temperature range for applications needing cooling performance.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PXIe-1092, 10-Slot (7 Hybrid Slots, 1 PXI Express System Timing Slot, 1 Peripheral Expansion Slot), Up to 24 GB/s PXI Chassis
784781-01
PXIe, 10-Slot (7 Hybrid Slots, 1 PXI Express System Timing Slot, 1 Peripheral Expansion Slot), Up to 24 GB/s PXI Chassis - The PXIe-1092 features a high-bandwidth backplane and up to 82 W of power and cooling in every slot to meet a wide range of high-performance test and … measurement application requirements. The all-hybrid backplane enables excellent flexibility for instrumentation module placement by accepting PXI Express modules in every slot and PXI hybrid-compatible modules in up to seven slots. It also offers a Timing and Synchronization option that includes a built-in oven-controlled crystal oscillator (OCXO) for increased clock accuracy and external clock and trigger routing. The chassis includes a peripheral expansion slot in Slot 10 to provide power only for multiple-slot wide modules.
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PCI To CPCI Or PXI Extender Board
MS 1720
PCI to CPCI Extender card is used for extending the standard desktop PCI bus to compatible CPCI bus. This will help to test all the CPCI and PXI cards without having a CPCI or PXI backplane. This card is very low cost board and very use to interface with standard board. This board also facilitates to debug the CPCI and PXI boards.
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32-bit PCI Test Backplane
SKU-014-01
The 32-bit PCI Test Backplane was designed to support production testing/debugging of PCI-based peripheral boards. The backplane expands the x1 PCI Express interface of the host computer into four 32-bit PCI slots via 7 ft CAT6 cable. The PCI backplane is a versatile platform that allows you to test up to 4 PCI boards at the same time, facilitates easy access to logic signals, provides hot-swap compatibility, and per-slot overcurrent protection.
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Signal Generator Adapter Module For FlexRIO
Signal Generator Adapter Modules for FlexRIO feature either high or low‐speed analog output and can be paired with a PXI FPGA Module for FlexRIO or the Controller for FlexRIO for custom signal generation. Whether you need to dynamically generate waveforms on the FPGA or stream them across the PXI backplane, these adapter modules are well suited for applications in communications, hardware‐in‐the‐loop (HIL) test, and scientific instrumentation.
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PXIe-1082DC, 8-Slot, DC Power Supplies, Up to 8 GB/s PXI Chassis
782946-01
PXIe, 8-Slot, DC Power Supplies, Up to 8 GB/s PXI Chassis—The PXIe‑1082DC features a high-bandwidth backplane to meet a wide range of high-performance test and measurement application needs. It accepts PXI Express modules in every slot and supports standard PXI hybrid-compatible modules in up to four slots. The chassis supports DC inputs from 11 V to 32 V.
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PXIe-1078, 9-Slot, Up to 1.75 GB/s PXI Chassis
781622-01
PXIe, 9-Slot, Up to 1.75 GB/s PXI Chassis—The PXIe‑1078 features a backplane that incorporates a PCI Express connection to every slot to meet a wide range of test and measurement application needs. It accepts PXI Express modules in every slot and supports standard PXI hybrid-compatible modules in up to five slots.
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PCI To Star Fabric Module
51-921A-001
The use of the StarFabric interface operating at 2.5Gb/s minimizes the impact on system speed. The PCI interface of the 51-921A supports both 32 bit and 64 bit operation and backplane speeds of 33MHz and 66MHz, ensuring the highest speed operation under all conditions. The StarFabric interface ensures the modules perform seamlessly with no impact on the test system software.
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3U / 6U PXIe Chassis
The GX7100e Series are 14-slot combination PXIe chassis that accommodate a 3U PXIe embedded controller or a MXI express controller as well as 3U & 6U PXI / PXIe insruments in 4U of rack space. The GX7100e’s unique format includes seven 6U slots and seven 3U slots arranged horizontally to reduce the overall size of the chassis, providing the versatility and high-density necessary to address many PXI / PXIe applications and requirements. The backplane architecture supports Gen 2, 4x4 PCI Express bus signaling and the use of both x1 or x4 system controllers. By offering a combination of PXI-1, Hybrid, and Express slots, the GX7100e offers users the ultimate in flexibility for general purpose as well as high bandwidth test needs.
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Electrical Receiver Conformance Test Application for IEEE 802.3bs/ cd
M8091BSCA
IEEE 802.3bs receiver test application for 200GAUI-4 and 400GAUI-8, covering chip-to-module, chip-to-chip, backplane, and copper cable interconnects.
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Time Domain Reflectometers and S-Parameter Analyzers
The Teledyne LeCroy WavePulser 40iX and the Teledyne Test Tools T3SP15D are a perfect combination of complimentary products to serve the requirements on testing, validating and troubleshooting cables, backplanes, connectors, transmission lines on boards and interconnect.
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Electrical Receiver Conformance Test Application for IEEE 802.3bs/cd
M8091BSCB
IEEE 802.3bs receiver test application for 200GAUI-4 and 400GAUI-8, covering chip-to-module, chip-to-chip, backplane, and copper cable interconnects.
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PXIe-1084, 18-Slot (17 Hybrid Slots), Up to 4 GB/s PXI Chassis
784058-01
PXIe, 18-Slot (17 Hybrid Slots), Up to 4 GB/s PXI Chassis—The PXIe-1084 features an all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
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VXI
VXI stands for VME eXtensions for Instrumentation. It is an open standard first developed by five leading Test and Measurement companies in 1987 to standardise a backplane capable of developing open, interchangeable instrument modules that could be used to build Automatic Test Equipment (ATE).Data Patterns designs and markets a wide range of VXI modules, some of which are listed below. Due to the use of the latest technologies, Data Patterns VXI modules offer the highest I/O density available in the industry today.Further enhancements of functional capabilities are achieved by the use of VXI IP carriers and VXI M Module carriers. This extends standard functions available from Data Patterns in these mezzanine architectures to the VXI platform.
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Backplane Test System
402HV
Our model 402HV is the result of 25 years of high voltage / high pin count test systems experience. We produced our first high voltage system back in 1985. It was programmable up to 600 volts / 600 Mohms and had over 49,000 test points. It could test a 5k point board in less that 15 seconds. Since then we have built hundreds of high voltage test systems, with our highest voltage system capable of testing up to 2000 Volts DC / 1500 Volts AC. (One of our 600 volt systems, built in 1986 is still in operation testing boards for a defense contractor.)
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Test Adapter
cPCI/VME/VME64x
The test adapter is used for measurement and testing of test specimen boards, which gives optimal access of signals, address lines as well as power from backplane assembly. Usually the test adapter includes fields for voltage and amp, current measurements and in some cases also some pins for wire wrap to conduct custom connections.
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PCI Express 4.0 Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Backplane & Cable Test
Backplane and cable test systems from Terotest include LINX, a fixtureless test system. Each LINX test card plugs directly into the unit under test, which removes the necessity for long test cables and fixtures. This is called distributed testing and results in dramatically lowered costs. LINX is extremely easy to use, with a self-learn function or input from CAD.
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Backplane Profiling & Inspection System
603d
A major problem in the backplane industry is detecting bent connector pin defects. The most difficult being when the pin bends underneath the shroud rather than going into the hole. Many times this defect cannot be detected electrically as the connector pin is touching the conductive annular ring of the hole, allowing electrical test to pass. Unfortunately, it is an intermittent connection and will fail later on as there is not an actual mechanical connection.
