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Spring Probes
Spring loaded electrical conductor contacting elements. AKA: Pogo Pin
See Also: Pogo Pin, Test Fixtures, Bed of Nails
- Pickering Interfaces Inc.
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Cable Assembly 68-Pin Micro-D Male to Unterminated, Ferrules, 2m, Spring Latch
A068SMR-F-5B200
The 68-Pin Connector to Unterminated Cable Assy is constructed from 7/36 (28AWG) twisted pair wires with polypropylene insulation. The wires are colour coded to match the connector pin designation. The connector can be secured to the product by a Metal Spring Latch.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Test Probes
Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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IEC60068-2-75 Ik08 Spring Impact Hammer
CX-IK08
Shenzhen Chuangxin Instruments Co., Ltd.
The spring Hammer consists of three principal parts: the body, the striking element and the release system. It's used to test the mechanical integrity of product enclosures. After applying the impact with the hammer, the product is examined with accessibility probes to determine access to shock, energy, and injury hazards. Built in exact accordance with IEC/EN, UL/CSA and other international standards.
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I-V Measurement Systems
The I-V Curve Data Acquisition includes a fixture for holding cells for testing (see Figure 1 below). This fixture can accommodate cells from small to up to 100 mm x 100 mm. Adjustable cell stops, in the X & Y-axis, are provided to consistently locate the cells for testing. Two micro-manipulators are provided as shown in Figure 1. Each micro-manipulator has two spring loaded contacts to allow 4-wire measurement even for cells that have top contacts only. Two back-side voltage contacts are embedded in the Plate (galvanically isolated from the Plate) and make good electrical contact when the cell is held down by vacuum to the plate. All voltage and current probes are gold-plated. The cell is held down with vacuum during testing (built-in vacuum pump).
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Standard Type Spring Probes
From for bare board to for ICT, we have variety of spring probes for PCB. In addition to variety of tip type and total length, we also have receptacles that match the best to spring probes. We can also attach lead wire to the receptacles.
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Manual Fixture Kit
230350 – CMK-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Alternate 0.99 (28.00) - 6.00 (170.00) Long Travel Bead Probe
BPLT-25F-6
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, Alternate Spring 400 mil / 10,16 mm, High Spring: 400 mil / 10,16 mm, Ultra High Spring: 350 mil / 8,89 mm
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Test Probes and Pins
Spring Loaded Test Probes for Circuit Board Testing, "Pogo Pins" Test Electronics sources and stockes a large variety of Test Probes and Spring Loaded Test Pins. Let our applications engineers help you find the correct pin for your test fixture application.
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IEC60335 Nail Test Probe
CX-Z12
Shenzhen Chuangxin Instruments Co., Ltd.
The Finger Nail Probe is indicated to test IEC 60335 and UL requirements. Used to check the security of parts that snap together. The spring gauge assembled in the handle can be calibrated to the necessary force for using the instrument. This probe is made of stainless steel with appropriated hardened tip and a handle in insulating material. Handle has a special adaptor M5 for use with 50N force gauges.
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Manual Fixture Kit With Changeable Cassette, Max number of probes (2N) 1000 units, Max UUT 580 x 400 mm (wxd)
CMK-04
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Spring Probes
Spring probes are designed to optimize performance in high reliability, multicycle applications. Smiths Interconnect's spring probes, featuring IDI contact technology, are compliant which makes them ideal for blind mate applications as they self correct for x, y, z, rotational and angular misalignment of the target. Offered in compressed heights less than 2 mm and utilized on pitches as tight as 0.4 mm, they are well suited for high density, board-to-board, battery contact and high frequency applications.
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Manual Fixture Kit
230355 – CMK-06
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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High 1.50 (43.00) - 9.60 (272.00) Long Travel Bead Probe
BPLT-1C-9.6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,450Overall Length (mm): 36.83Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, High Spring: 350 mil / 8,89 mm
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Manual Fixture Kit with Changeable Cassette, Max number of probes (2N) 500 units, Max UUT 230 x 175 mm (wxd)
CMK-06
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Long Spring Ground for ZD Differential Probe Qty 2
PACC-ZD003
Long spring ground for ZD differential probe Qty 2
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Mems-Based Probe Cards
MEMSFlex
Nidec SV Probe proprietary MEMSFlex™ Probes are a perfect complement to our probe card technologies, ideal for many advanced testing applications including Flip Chip, WLCSP, Solder Bump, CuPillar and Pad. Featuring a fine 3D MEMS coil spring and electro-formed Ni-pipe, these probes are manufactured using a continuous, automated, manufacturing process, we can support a wide array of custom pin pitches within a short cycle. Other features include:
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High Force Type Spring Probes
Total length of spring probes for high force is longer than standard type and is more optimized to use for testing PCB. We have 1mm to 2.54mm pitch and you can choose not only tip type but also spring force for each pitch. This makes it possible for you to choose spring probe suits the best for your use.
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Linear Testfixture for VPC iCon i1 Mass Interconnected Cassette Interface (Cassette Not Included) 6 or 10 Positions Blocks, UUT 456 x 320 mm
MG-07-01
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 456 x 320 mm (wxd)• Outer dimensions: 620 x 589 x 100 x 184 mm (wxdxh1xh2)• Equipped with dedicated cassette• Up to a maximum of 8 interface blocks of 160 or 170 signals• All interface blocks can be customized
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Board Test Fixture Probes
Offering a wide range of standard spring contact probes to meet your testing requirements and has long been recognized as the world’s largest probe manufacturer. With over 60 different probe series ranging from 0.02" (0.51 mm) to 0.187" (4.75 mm) pitch with multiple length, travel, ICT, lead free and rotator options, we provide a full portfolio designed for general purpose test on bare boards, loaded printed circuit boards and surface mount assemblies.
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Manual Fixture Kit with Changeable Cassette, Max number of probes (2N) 500 units, Max UUT 197 x 114 mm (wxd)
CMK-05
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Standard 1.09 (31.00) - 4.50 (128.00) Long Travel Bead Probe
BPLT-1HL-4.5
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,450Overall Length (mm): 36.83Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, High Spring: 350 mil / 8,89 mm
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Linear Testfixture (Cassette Not Included), UTT 456 x 320 mm
MG-07
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 456 x 320 mm (wxd)• Outer dimensions: 620 x 590 x 100 x 184 mm (wxdxh1xh2)• Designed for changeable cassette
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High 1.50 (43.00) - 9.60 (272.00) Long Travel Bead Probe
BPLT-1F-9.6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,450Overall Length (mm): 36.83Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, High Spring: 350 mil / 8,89 mm
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Electrical Tester Grid Field
TCI can furnish grid spring probes for most Bare Board Electrical Testers in production at most Printed Circuit Board Manufactures. Look for your model of Bare Board Tester in the following list and call TCI for current price quotation.
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ATE Socket
Design ATE socket according to customer's requirementsUse on auto-test eqiupments and handler.Pitch range from 0.30 to 1.0mm.Pin amount: 2 and above.Key material: Peek,Torlon.etcContact with top pogo pin
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Manual Fixture Kit
230353 – CMK-04
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Manual Fixture Kit
230372 – CMCSK-03-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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High Frequency Spring Probes
We have spring probes for high frequency for 0.5 and 0.8mm pitch. We provide spring probe with low insertion loss by shorten the total length to 1.5mm (use length 1.1mm).
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Standard 1.09 (31.00) - 4.50 (128.00) Long Travel Bead Probe
BPLT-1HF-4.5
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,450Overall Length (mm): 36.83Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, High Spring: 350 mil / 8,89 mm
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Spring Probes
An essential component in the testing of electronic components. In Test & Measurement applications, they are used to make contact with test points, connecting the DUT (device under test) with the test equipment.
