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- Applied Rigaku Technologies, Inc
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NEX CG II Energy Dispersive X-ray Fluorescence Spectrometer
NEX CG II
Applied Rigaku Technologies, Inc
NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
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Energy Dispersive X-ray Fluorescence Spectroscopy
Energy Dispersive X-ray Fluorescence Spectroscopy
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Energy Dispersive X-ray Fluorescence (ED-XRF) Spectrometer
XEPOS
SPECTRO Analytical Instruments GmbH
The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It provides breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits yielding remarkable gains in precision and accuracy. The amazing SPECTRO XEPOS excels at critical tasks from rapid screening analysis to precise product quality control. Apply it for at-line processing in a variety of industries, for geology and mining, for environmental and waste monitoring, and for research and academia.
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Energy Dispersive X-ray Fluorescence Analyzer
X-5000
HORIBA continues it's innovation in the petroleum market by proudly teaming with Olympus Innov-X to promote the X-5000 Mobile XRF Analyzer. The X-5000 is a rugged, fully integrated closed beam portable EDXRF system that offers the power and performance of a traditional benchtop XRF, but is designed for transportable operation. Using a Silicone Drift Detector, low PPM detection limits can be achieved for many elements in a variety of sample types and matrices. Applications include fuels, additives, and wear metal oils to crude oils, water, coke, and coal allow this easy to use analyzer to be a fast, flexible solution to traditional testing methods.Detectable elements to concentrations of 100% are: Aluminum, Antimony, Barium, Cadmium, Calcium, Chlorine, Chromium, Copper, Iron, Manganese, Molybdenum, Nickel, Phosphorous, Potassium, Silicon, Silver, Sulfur, Tin, Titanium, Vanadium, and Zinc.
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Wavelength Dispersive X-ray Fluorescence Spectroscopy
Wavelength Dispersive X-ray Fluorescence Spectroscopy
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Energy Dispersive X-ray Spectroscopy
EDS
Materials Evaluation and Engineering
EDS is an elemental chemical microanalysis technique performed in conjunction with each of the SEMs at MEE. Features or phases as small as about 1 micron can be analyzed.
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Energy Dispersive X-Ray Spectroscopy (EDS)
Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
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Dispersive X-ray Fluorescence (EDXRF) Analyzers
Petro-Marine
The powerful Energy Dispersive X-ray Fluorescence (EDXRF) analyzers of Xenemetrix are capable of more sensitive and precise analysis than can be expected from a laboratory class analyzer.
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X-ray Fluorescence
XRF analysis – one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed.
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Dispersive X-ray Fluorescence Spectrometer
SPECTRO MIDEX
SPECTRO Analytical Instruments GmbH
The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.
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X-ray Fluorescence Spectrometer
X-ray fluorescence spectrometer that provides quick, easy elemental analysis using touch screen operation. It is equipped with functions for conventional qualitative and quantitative analysis (FP method, calibration curve method), as well as screening for RoHS elements. With a variety of both hardware and software options available, it is customizable to cover a wide range of analysis needs.
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Energy Dispersive X-ray Fluorescence Spectroscopy Systems
Energy Dispersive X-ray Fluorescence Spectroscopy Systems
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X-Ray Fluorescence Analyzer
MESA-50
HORIBA has been selling the XGT-WR series of EDXRF analyzers for many years, providing screening measurements of samples containing hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS, ELV, and Cl for halogen free applications.XGT systems are used daily throughout the world. HORIBA has now developed the new MESA-50 EDXRF analyzer, based on its long experience with customer requirements and knowledge. MESA-50 provides user friendly operation and good performance. MESA-50 includes three analysis diameters, suitable for every sample, from thin cables and electronic parts to bulk samples. The combination of SDD detector and Digital pulse processor(DPP) changes the image of EDXRF.HORIBA's new MESA-50 supports ecological procurement; it contributes not only to EU RoHS and ELV compliance testing, but also regulatory work for many other countries.
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X-ray Fluorescence Sulfur-in-Oil Analyzer
K581
Chongqing Kailian Yongrun Industrial Co.,Ltd.
It is designed to test mass(%) of total sulfur in crude petroleum, petroleum, heavy oil, diesel oil, gasoline and naphtha; to test total sulfur content in products of coal chemical industry, for instance primary benzene; to test total sulfur or sulfide in other liquids or solid power samples.Conforms to ASTM D4294, GB/T 17040 and GB/T 11140.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY 5000
Inline measuring with highest precision for thin films. Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
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X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
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X-ray Fluorescence Spectroscopy (XRF) Services
Work we''ve done: Coating identification, Measuring lead levels in paint and solder, Elemental comparison of two metal ingots, Restriction of Hazardous Substance (RoHS) testing.
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Energy Dispersive X-ray Fluorescence Spectrometer
Pharmaceutical Elemental Impurities Analysis System
Control of Elemental Impurities in Pharmaceuticals In the pharmaceutical industry, the analysis of elemental impurities is necessary to ensure the safety of pharmaceuticals. In December 2014, the "Guideline for Elemental Impurities" (Q3D) was issued by the International Council for Harmonisation of Technical Requirements for Pharmaceuticals for Human Use (ICH), consisting of representatives from Europe, the U.S. and Japan. In Japan, the "Guideline for Elemental Impurities in Drug Products" (PFSB/ELD Notification 0930 #4 from the Ministry of Health, Labour and Welfare) was issued, and will be applied to new drug products submitted for approval after April 1 2017. For 24 elements categorized in Class 1 to Class 3, residual quantities in pharmaceutical drug products must be controlled within permissible limits. Although ICP-AES and ICP-MS are used for precise analysis of elemental impurities, X-ray fluorescence spectrometers can be used as an alternative analysis method. This is because they can quantitatively and qualitatively analyze a variety of elements nondestructively, and without chemical pretreatment, unlike ICP-AES and ICP-MS systems. The X-ray fluorescence spectrometry has been adopted as a general method of analysis in the U.S Pharmacopeia and the European Pharmacopoeia. (USP<735>, Ph.Eur.2.2.37)
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X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-60
HORIBA introduces the new standard of transportable sulfur-in-oil analyzers, the SLFA-60. This instrument introduces new software and hardware features to meet the growing changes in the petroleum industry. The instrument has expanded storage of calibration curves and data can be exported using USB output. The measurement range has increased to 0-9.9999 wt% to cover high sulfur crudes and shale oil markets.
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Fluorescence Detector
RF-20A/RF-20Axs
The excellent basic performance of the Prominence series is further enhanced by the RF-20A/RF-20Axs fluorescence detectors, which offer world-class sensitivity, excellent ease of maintenance, and validation support functions. They support a wide range of applications from conventional analysis to high-performance analysis.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDL®
Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis.
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Fluorescence Spectrometers
Our experience and expertise as manufacturers of fluorescence spectrometers is second to none. Spanning more than 50 years, we have over 1000 high-end spectrometers installed in universities and leading research laboratories worldwide. Our sales team would be delighted to assist you with your fluorescence spectroscopy analysis and instrumentation requirements.
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Tube-Above Wavelength Dispersive X-ray Fluorescence Spectrometer
ZSX Primus IV
As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Guidance supports you in all aspects of measurement and data analysis. Can accurate analysis only be performed by experts ? No — that is in the past. ZSX Guidance software, with the built-in XRF expertise and know-how of skilled experts, takes care of sophisticated settings. Operators simply input basic information about samples, analysis components and standard composition. Measured lines with the least overlap, optimum backgrounds and correction parameters (including line overlaps) are automatically set with aid of qualitative spectra.
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Energy Dispersive X-ray Fluorescence Spectrometer
EDX-LE
EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability. The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive.
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Fluorescence Microscopy Solutions
Bruker’s suite of fluorescence microscopy systems provides a full range of solutions for life science researchers. Our multiphoton imaging systems provide the imaging depth, speed and resolution required for intravital imaging applications in neuroscience, oncology and immunology.
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X-ray Microscopy
Xradia Family
✔ Characterize the properties and behaviors of your materials non-destructively.✔ Reveal details of microstructures in three dimensions (3D).✔ Develop and confirm models or visualize structural details.✔ Achieve high contrast and submicron resolution imaging even for relatively large samples.
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Desktop Fluorescence Microscope
Nanoimager
The complete package for super-resolution microscopy
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Energy Meters
DCBM 100
*Voltage measurement 150 to 1000 V DC*Current range 80A*Bi-directional energy metering
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Energy Detectors
Our pyroelectric energy meters cover a very wide range, going from nanojoules to several tens of joules per pulse. They also come in various sizes, from 8 mm to 95 mm in diameter and most of them are available with an optional attenuator.
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Energy Probes
RjP-700 Series
The RjP-700 Series probes are designed to measure lower pulse repetition rate, longer duration pulses - up to 1msec pulse width at a maximum rep rate of 40Hz. This allows for measurement of pulsed flashlamps and other sources not possible with other probes. The combination of large area detector surface and long pulse width allow for measurements up to several Joules total energy. Integrated preamplifiers allow for longer probe-to-instrument cable runs, useful for manufacturing environments.