Applied Image, Inc.
APPLIED IMAGE Inc. is a world leader in the design and manufacture of precision-imaged optical components intended for a wide range of applications and industries that require NIST-traceable standards and/or precision-imaged components to test, calibrate, align, control or measure their optical or photonics systems. In addition to its large catalog of standard products, APPLIED IMAGE specializes in designing and manufacturing custom components, imaged to the strictest tolerances. Its mission is to provide the highest-quality products and customer service to consistently meet and exceed the expectations of its customers such as NASA (Mars Rover) and Goddard (International Space Station).
- (585) 482-0300
- (585) 288-5989
- info@appliedimage.com
- 1653 East Main Street
Rochester, NY 14609
United States of America
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SINE FBI Charts
There are two SINE Sinusoidal arrays designed for FBI applications: the SINE M-13-60-S-RM and the SINE M-13-60-FBI Kit.The SINE M-13-60-S-RM was designed jointly by the Federal Bureau of Investigation, of Washington DC, and MITRE, of Bedford MA. The primary function of this Target is for computing Modulation Transfer Function (MTF) evaluation in live scanner fingerprint systems for conformance to Integrated Automated Fingerprint Identification Systems (AFIS) image quality requirements. The array...show more -
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ACCUplace Land Pattern Kit
APKIT-1
APPLIED IMAGE, in conjunction with Hewlett Packard Corp., has developed a unique, and extremely accurate, pick & place target set designed to check for accuracy and repeatability of your robotic system quickly and easily.
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AIIM Test Charts (Scanner/Microfilm/Digital/ Copier)
AIIM Test Charts (Scanner/Microfilm/Digital/ Copier) by Applied Image - Motion-Rotary Target, Planetary-Static Target, Small Area Target/AIIM MS-303-1980, Small Scanner Resolution Target , Copier Test Array, Rotary Test Target/AIIM X113, Film Strip Target, Eastman Kodak Copier/Scanner Digital Test Target, Small Color MTF Target
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Individual UPC Bar Code Standards
The UPC Verification Calibration standards are a unique set of symbols that assures an exact and reliable primary bar code standard exists for UPC codes based on ANSI X3.182/ISO 15416 methodology. These standards assures that manufactures of verification equipment, scanners, QC labs and end users now have an accurate basis for checking the measurement capabilities of their equipment. These standards are intended as a fundamental calibration tool for an QC program, providing a continuous scale ...show more -
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O.E.M. Specific Test Charts
O.E.M. Specific Test Charts by Applied Image - IMATEST SFRPlus Chart, ISA ColorGauge Targets, ISA Device Level Target, ISA Object-Level Target Family, ISA Spatial Frequency Response Target
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Reticles / Graticules
With over 30 years experience in the manufacturing of high precision Custom and Standard Reticles for a wide range of applications, APPLIED IMAGE has gained a reputation for delivering precision and accuracy parts on time. Using our state of the art technology, our components are the most precise in the industry. Applications of this technology is useful in Day/Night Sights, Binoculars, Targeting Systems, Telescopes, Tank Sights, Microscopes, and many other Bore-Sight devices.
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Conformance Calibration Standard Test Card for ITF-14 (Interleaved 2 of 5) Symbol Verifiers
AI-CCS-ITF-14
This test card is ideal for testing verifiers, scanners, and other ITF-14 (Interleaved 2 of 5) barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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Conformance Calibration Standard Test Card for GS1-DataBar Symbol Verifiers
AI-CCS-DATABAR
This test card is ideal for testing verifiers, scanners, and other GS1-DataBar barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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Barcode Conformance Calibration Standards
Barcode symbol quality has been at the forefront of discussion among practitioners in the automatic identification and data capture (AIDC) industry since they were invented in 1951. Barcodes became commercially successful when they were used to automate checkout systems at grocery stores, with the very first scanning of the Universal Product Code (UPC) on a pack of Wrigley Company chewing gum in June 1974. The Uniform Code Council (UCC) published barcode quality guidelines, and ANSI X3.182-1990 became the first published standard for barcode quality. Since then, ISO/IEC 15416 for 1D symbols and ISO/IEC 15415 for 2D symbols have become the global standards for grading printed barcodes.
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SINE Sinusoidal Single Frequency Gratings
Our SINE Sinusoidal Single Frequency transmittance patterns have proved to be very useful for specialized MTF Measurement as well as for such applications as moirè contouring. They are made on film base material with a nominal thickness of 0.175mm. This material is polyester and tends to be somewhat birefringent. The harmonic modulation values are generally 3% or less.
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SINE M-15-60 Sinusoidal Array
The reflective Sinusoidal Array SINE M-15-60 is similar to the M-13-60 (1X version) except that the range of spatial frequencies begins with 0.25 cycles per mm and extends to 20 cycles per mm. To compensate for the additional frequencies, the 3/16 cycles per mm area has been eliminated. Both arrays are imaged on Photo Paper.
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Stage Micrometer Measuring Scales
The SM Series of Stage Micrometer Calibration Standards is ideally suited for calibrating optical, imaging, video as well as reticle based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Our SM series covers a range of low to high power systems, and can always be custom manufactured to perfectly fit your needs.
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EIA Test Charts
EIA Test Charts by Applied Image - EIA Halftone Gray Scale Chart, EIA Video Resolution Pattern
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SINE (Sinusoidal) Targets & Arrays
Sinusoidal Target Arrays have been recognized as a superior test method for a variety of applications, from moiré contouring to reliable MTF Evaluation of materials, lenses, cameras, and electro-optical systems (Follow the hyperlink to learn about using Sinusoids for MTF eval). Sinusoidal Pattern Arrays are manufactured on two different materials for both reflective and transmissive applications. Because of the inherent limitations of reflective materials, the maximum spatial frequency of the r...show more -
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Custom Optical Components and Standards
With the amount of applications that optical components have, no one could hope to have the perfect component for every possible scenario. For this reason, APPLIED IMAGE makes easy the process of designing, building, and delivering custom components to our customers. Our engineering process is designed to produce the best parts in the industry and more importantly, the best component for your specific needs. The APPLIED IMAGE experience will cover the project with expert engineers from start to finish. Use the form below to start the conversation for checkerboard and dot arrays, stage and image analysis micrometers, reticles and machine vision components.
